Near Field Probes (E & H)

Near field probes use frequency-specific, E-field and H-field probes accompanied with an electromagnetic interference (EMI) analyzer to detect electromagnetic emissions and locate vulnerabilities in the device under test (DUT). Typically, these probes are used to complete pre-compliance electromagnetic compatibility (EMC) testing on a device by identifying the presence of EMI through the detection of electrical and magnetic energy in the field around the DUT. E-field probes can interact with electric fields generated by voltage changes through direct contact of a circuit and tracing the emission on individual pins or a circuit board. H-field probes have a conductive loop on the end that is responsive to magnetic fields generated by current changes and can detect the magnetic field when scanning the DUT. Both of these probes are used together to reveal the source of EMI.

Avalon Test Equipment carries a variety of near field probes to meet your testing requirements. Rent from Avalon and Test With Confidence®.