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Keysight/Agilent 4156C Semiconductor Parameter Analyzer

Manufacturer part number: 4156C
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The Keysight 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the 4156C provide a firm foundation for future expansion with other measurement instruments. This unit comes with four source/monitor units, two voltage monitor units, and two voltage source units.

Features:

  • Highly accurate laboratory benchtop parameter analyzer for advanced device characterization
  • 4x High-resolution SMU, 2xVSU, and 2xVMU
  • Fill-in-the blanks front panel operation
  • Includes Desktop EasyEXPERT software for PC-based GUI instrument control
  • Four built-in high-resolution source /monitor units, two voltage source units, and two voltage monitor units
  • Measurement resolutiuon: 1fA and 0.2µV
  • Full Kelvin: force, sense, and guard terminals for each HRSMU
  • Performs quasi-static capacitance measurements versus voltage measurements
  • Automatically extracts process parameters without manually manipulating screen markers
  • Measures leakage characteristics with ultra-low leakage SMUs
  • Automates device characterization with integrated pulse generators and selector switches
  • On-wafer reliability tests with built-in stressing modes
  • Point-and-click measurements with graphical user interface
  • Provides graphical data analysis capabilities with a Windows environment
  • QSCV, Stress Mode, Knob-sweep, Stand-by function
  • Triggering modes allow synchronized AC/DC measurements
  • IBASIC user functions allow data to be plotted and analyzed
  • PS/2 keyboard
  • Power cable
  • Documentation CD
  • Interlock cable
  • LAN I/F test adapter
  • BNC Cable (M-M)
  • Front frame LG cover
  • 3 lug triaxial cable (M-Alligator)
Description

The Keysight 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the 4156C provide a firm foundation for future expansion with other measurement instruments. This unit comes with four source/monitor units, two voltage monitor units, and two voltage source units.

Features:

  • Highly accurate laboratory benchtop parameter analyzer for advanced device characterization
  • 4x High-resolution SMU, 2xVSU, and 2xVMU
  • Fill-in-the blanks front panel operation
  • Includes Desktop EasyEXPERT software for PC-based GUI instrument control