Close
You have no items in your shopping cart.

ISO 7637-2 | 7637-3

ISO 7637-2 is a test standard developed by ISO (International Organization for Standardization) concerning electrical transient conduction along power supply lines in road vehicles. The purpose of this standard is to define test methods and procedures of equipment installed on passenger cars and commercial vehicles with 12 V or 24 V electrical systems to ensure their compatibility to conducted electrical transients. ISO 7637-2 defines the function performance status classification for the immunity to transients. It also specifies bench tests for both the injection and measurement of transients and applies to all types of road vehicles separate from the propulsion systems.

ISO 7637-3 concerns electrical transient transmission by capacitive and inductive coupling from lines other than supply lines. The purpose of this standard is to specify bench test methods to assess the immunity of devices under test (DUT) to transient pulses that are coupled to lines other than supply lines in road vehicles with 12 V or 24V electrical systems. There are three test methods described in ISO 7637-3, capacitive coupling clamp (CCC) method, direct capacitive coupling (DCC) method, and Inductive coupling clamp (ICC) method. During testing, the test pulses can replicate both fast and slow transient disturbances that can be caused by switching inductive loads and relay contact bounce.

Avalon Test Equipment carries a variety of test equipment for rent from top manufacturers (EM Test and Teseq) to meet both ISO 7637-2 and ISO 7637-3 requirements. Test With Confidence®.

ISO 7637-3 CCC TEST SETUP

Read More

Read Less

3 Items in Grid 4 Items in Grid List

EM Test LD 200N Load Dump Generator

In stock and ready to rent at Avalon! Load Dump pulses simulate a sudden battery disconnection from the alternator.

EM Test UCS 200N100 Ultra-Compact Simulator

The UCS 200N100 by EM Test is in stock and ready to rent! The Ultra-Compact Simulator series for Automotive Transients unifies the capabilities of an EFT/Burst simulator, a Micro-pulse simulator, and the required coupling network into one box. Lab staff with over 20 years of technical experience. Customer service is our top priority. Immediate sales assistance along with same day shipments. Rent from Avalon Test Equipment.

EM Test VDS 200N50 Voltage Drop Simulator

Voltage Drop Simulator, 60V/50A

Teseq NSG 5500-1 Automotive Transient Immunity Tester

Included in base system: HV Supply, Processor, Power Entry Module, RS232 Interface, IEEE Interface, CDN 5500 100A coupler, FT 5530 Fast Transient Generator, Autostar Software, traceable calibration certificate.

Teseq CDN 500 Capacitive Coupling Clamp

Manufactured exactly in accordance with the drawings and specifications of ISO 7637-3 for capacitively coupling the transients onto cables and wiring harnesses. With its characteristic impedance of 50 Ω , connected to the generator via a coaxial cable and terminated on the far side with a 50 Ω load resistor.

EM Test VDS 200Q100 4-Quadrant Voltage Drop Simulator

The VDS 200Q series is used to simulate the various battery supply waveforms recommended by international standards and by car manufacturer requirements. Available to rent!

Teseq AES 5501 Automotive Emissions System

A system of electronic and mechanical switches, an artificial network, and a unique control station designed for emissions testing to ISO 7637-2.

EM Test VDS 200N15 Automotive Voltage Drop Simulator 60V/15A

The VDS 200N series is used to simulate the various battery supply waveforms recommended by international standards and by car manufacturer requirements.

EM Test PFS 200N100 Power Fail Simulator 80V100A

The PFS 200N Series Automotive Power Fail simulator is used to comply with standard requirements, mainly from vehicle manufacturers, to perform fast voltage dips ad drops (micro-interruptions). Some standards specify very fast rise and fall times below 1 microsecond an electronic switch.

EM Test ACC Capacitive Coupling Clamp

Used to couple fast transient pulses to I/O lines as required in different national and international standards and car manufacturer specifications for automotive testing.