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Rohde & Schwarz HZ-15.02 Probe Set

Manufacturer part number: HZ-15.02
Rohde & Schwarz HZ-15.02 Probe Set for E and H Near-Field Emissions 30 MHz to 3 GHz
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Near-field measurements are often performed if, for example, a developer has to find out why an emission limit of an EMC standard is exceeded. Based on field strength measurements, the developer already knows several critical frequencies of the device or module under test. A practical way to reduce EMI is to analyze near fields, locate the sources and come up with targeted countermeasures. Furthermore, the passive near-field probes can also be used for immunity measurements.

Before you perform a near-field analysis, you first need to know how the E and H fields are distributed. The five probes from the R&S®HZ-15 probe set are well suited for this purpose.

All near-field probes are designed for ease of use, and are ideal for measuring high-frequency fields starting at 30 MHz on printed boards and on components.

The magnetic field probes include special electrically shielded probe tips. The various probe tip shapes are designed for tasks in near-field measurements. The upper limit frequency of a probe is determined by the size and design of the probe tip. All probes are passive and are connected to the 50 Ω input of a test receiver, spectrum analyzer or oscilloscope.

  • E Field Probes: RSE02, RSE10
  • H Field Probes: RSH400-1, RSH50-1, RSH2.5-2
  • Frequency Range: 30 MHz to 3 GHz
  • RF Output: SMB (female), 50 Ω
  • Isolation Voltage: 60 V DC / 42.4 V AC (peak)
  • Maximum RF Input Power
    • RSE02, RSE10: 5 W
    • RSH400-1, RSH50-1: 4 W
    • RSH 2.5-2: 0.5 W
  • Temperature Range
    • Operating: +5°C to 45°C
    • Storage: –40°C to +70°C
  • Dimensions, Overall: 240 mm x 55 mm x 195 mm (9.45 in x 2.17 in x 7.7 in)
  • Weight (In Case): 400 g (0.88 lbs)
Description

Near-field measurements are often performed if, for example, a developer has to find out why an emission limit of an EMC standard is exceeded. Based on field strength measurements, the developer already knows several critical frequencies of the device or module under test. A practical way to reduce EMI is to analyze near fields, locate the sources and come up with targeted countermeasures. Furthermore, the passive near-field probes can also be used for immunity measurements.

Before you perform a near-field analysis, you first need to know how the E and H fields are distributed. The five probes from the R&S®HZ-15 probe set are well suited for this purpose.

All near-field probes are designed for ease of use, and are ideal for measuring high-frequency fields starting at 30 MHz on printed boards and on components.

The magnetic field probes include special electrically shielded probe tips. The various probe tip shapes are designed for tasks in near-field measurements. The upper limit frequency of a probe is determined by the size and design of the probe tip. All probes are passive and are connected to the 50 Ω input of a test receiver, spectrum analyzer or oscilloscope.